| Paper ID | TEC-04.15 | ||
| Paper Title | Weakly-Supervised Defect Segmentation within Visual Inspection Images of Liquid Crystal Displays in Array Process | ||
| Authors | Fan Li, Guoqiang Hu, Shengnan Zhu, IBM, China | ||
| Session | TEC-04: Machine Learning for Image and Video Processing II | ||
| Time | Monday, 26 October, 18:30 - 19:25 | ||
| Topic | [TEC] Image & Video Processing Techniques: [TEC-MLI] Machine Learning for Image and Video Processing | ||
| IEEE Xplore Open Preview | Click here to view in IEEE Xplore | ||
| Virtual Presentation | Click here to watch in the Virtual Conference | ||