MLSP-L5.6
DYNAMIC VIDEO FRAME INTERPOLATION WITH INTEGRATED DIFFICULTY PRE-ASSESSMENT
Ban Chen, Xin Jin, Youxin Chen, Longhai Wu, Jie Chen, Samsung Electronics (China) R&D Center, China; Jayoon Koo, Cheul-hee Hahm, Samsung Electronics, Korea, Republic of
Session:
MLSP-L5: Machine Learning for Image and Video Processing I Lecture
Track:
Machine Learning for Signal Processing
Location:
Room E3
Presentation Time:
Tue, 16 Apr, 18:10 - 18:30 (UTC +9)
Session Co-Chairs:
A. Murat Tekalp, Koc University and Mohsen Naqvi, Newcastle University
Session MLSP-L5
MLSP-L5.1: PhyOT: Physics-informed object tracking in surveillance cameras
Kawisorn Kamtue, José Moura, Carnegie Mellon University, United States of America; Orathai Sangpetch, Carnegie Mellon University - CMKL, Thailand; Paulo Garcia, Chulalongkon University, Thailand
MLSP-L5.2: ROBUSTNESS EVALUATION OF MACHINE LEARNING MODELS FOR ROBOT ARM ACTION RECOGNITION IN NOISY ENVIRONMENTS
Elaheh Motamedi, Kian Behzad, Rojin Zandi, Northeastern University, United States of America; Hojjat Salehinejad, Mayo Clinic, United States of America; Milad Siami, Northeastern University, United States of America
MLSP-L5.3: UNSUPERVISED CONTINUAL LEARNING OF IMAGE REPRESENTATION VIA REMEMORY-BASED SIMSIAM
Feifei Fu, Yizhao Gao, Zhiwu Lu, Renmin University of China, China; Haoran Wu, Shiqi Zhao, China Unicom Research Institute, China
MLSP-L5.4: A DENSITY-GUIDED TEMPORAL ATTENTION TRANSFORMER FOR INDISCERNIBLE OBJECT COUNTING IN UNDERWATER VIDEOS
Cheng-Yen Yang, Hsiang-Wei Huang, Zhongyu Jiang, Hao Wang, University of Washington, United States of America; Farron Wallace, National Oceanic and Atmospheric Administration (NOAA), United States of America; Jenq-Neng Hwang, University of Washington, United States of America
MLSP-L5.5: TWO-STAGE TRANSFER LEARNING FOR FUSION AND CLASSIFICATION OF AIRBORNE HYPERSPECTRAL IMAGERY
Benjamin Rise, Murat Uney, Xiaowei Huang, University of Liverpool, United Kingdom of Great Britain and Northern Ireland
MLSP-L5.6: DYNAMIC VIDEO FRAME INTERPOLATION WITH INTEGRATED DIFFICULTY PRE-ASSESSMENT
Ban Chen, Xin Jin, Youxin Chen, Longhai Wu, Jie Chen, Samsung Electronics (China) R&D Center, China; Jayoon Koo, Cheul-hee Hahm, Samsung Electronics, Korea, Republic of
Contacts