Technical Program

Paper Detail

Paper IDTEC-05.1
Paper Title A SIAMESE NETWORK UTILIZING IMAGE STRUCTURAL DIFFERENCES FOR CROSS-CATEGORY DEFECT DETECTION
Authors Chenhui Luan, Ruyao Cui, Lei Sun, Beijing Institute of Technology, China; Zhiping Lin, Nanyang Technological University, Singapore
Session TEC-05: Machine Learning for Image and Video Processing III
TimeMonday, 26 October, 19:30 - 20:25
Topic [TEC] Image & Video Processing Techniques: [TEC-MLI] Machine Learning for Image and Video Processing
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