MLSP-L13.5
IPCL: ITERATIVE PSEUDO-SUPERVISED CONTRASTIVE LEARNING TO IMPROVE SELF-SUPERVISED FEATURE REPRESENTATION
Sonal Kumar, Anirudh Phukan, Arijit Sur, Indian Institute of Technology Guwahati, India
Session:
MLSP-L13: Self-Supervised and Semi-Supervised Learning II Lecture
Track:
Machine Learning for Signal Processing
Location:
Room 104
Presentation Time:
Thu, 18 Apr, 09:40 - 10:00 (UTC +9)
Session Co-Chairs:
Danilo Comminiello, Sapienza University of Rome and Zheng-Hua Tan, Aalborg University
Session MLSP-L13
MLSP-L13.1: LEARNING GENERALIZABLE VISUAL REPRESENTATIONS VIA SELF-SUPERVISED INFORMATION BOTTLENECK
Xin Liu, Ya-li Li, Shengjin Wang, Tsinghua University, China
MLSP-L13.2: A RECONSTRUCTION-BASED FEATURE ADAPTATION FOR ANOMALY DETECTION WITH SELF-SUPERVISED MULTI-SCALE AGGREGATION
Zuo Zuo, Xi’an Jiaotong University, China; Zongze Wu, Shenzhen University, China; Badong Chen, Xi’an Jiaotong University, China; Xiaopin Zhong, Shenzhen University, China
MLSP-L13.3: Search for gravitational wave probes - A self-supervised learning for pulsars based on signal contexts
Shen Wang, Fudan University, China; Xiaofeng Cheng, Zhejiang Lab, China; Ming Xie, Yuhang Ling, Chao Liu, Mingmin Chi, Fudan University, China; Pei Wang, National Astronomical Observatories, Chinese Academy of Sciences, China; Zhongyi Sun, Yabiao Wang, Tencent Youtu Lab, China
MLSP-L13.4: Elevating Skeleton-Based Action Recognition with Efficient Multi-Modality Self-Supervision
Yiping Wei, Kunyu Peng, Karlsruhe Institute for Technology, Germany; Alina Roitberg, University of Stuttgart, Germany; Jiaming Zhang, Junwei Zheng, Ruiping Liu, Yufan Chen, Karlsruhe Institute for Technology, Germany; Kailun Yang, Hunan University, China; Rainer Stiefelhagen, Karlsruhe Institute for Technology, Germany
MLSP-L13.5: IPCL: ITERATIVE PSEUDO-SUPERVISED CONTRASTIVE LEARNING TO IMPROVE SELF-SUPERVISED FEATURE REPRESENTATION
Sonal Kumar, Anirudh Phukan, Arijit Sur, Indian Institute of Technology Guwahati, India
MLSP-L13.6: Pseudo Labels Regularization for Imbalanced Partial-Label Learning
Mingyu Xu, Zheng Lian, Bin Liu, Chinese Academy of Sciences, China; Zerui Chen, Chinese-American Joint Program of RDFZ XISHAN School, China; Jianhua Tao, Department of Automation, Tsinghua University, China
Contacts