TU4.L11.1
WEAKLY SUPERVISED DEFECT LOCALIZATION WITH RESIDUAL FEATURES
Gaku Minamoto, Satoshi Ito, Osamu Yamaguchi, Takahiro Takimoto, Toshiba Corporation, Japan
Session:
TU4.L11: Industry 3 Lecture
Track:
Industry
Location:
Dena'ina: Tikahtnu Ballroom D/E
Presentation Time:
Tue, 16 Sep, 15:00 - 15:15 Anchorage Time (UTC -8)
Session Chair:
Jianquan Liu, NEC Corporation
Session TU4.L11
TU4.L11.1: WEAKLY SUPERVISED DEFECT LOCALIZATION WITH RESIDUAL FEATURES
Gaku Minamoto, Satoshi Ito, Osamu Yamaguchi, Takahiro Takimoto, Toshiba Corporation, Japan
TU4.L11.2: Holism to Atomism: Enhancing the Vision-Language Alignment for Cross-Modal Few-Shot Learning
Boyu Yang, Mingjie Li, Xi Chen, Liang Li, Chao Deng, Junlan Feng, china mobile research institute, China
TU4.L11.3: NO-REFERENCE TEXTURED MESH QUALITY ASSESSMENT USING GRAPH-BASED FEATURES
Ryosuke Watanabe, Hanif Fermanda Putra, Tomoaki Konno, Sei Naito, KDDI Research, Inc., Japan
Contacts