TU4.L11: Industry 3
Tue, 16 Sep, 15:00 - 15:45 Anchorage Time (UTC -8)
Location: Room IND
Session Type: Lecture
Track: Industry
Click the to view the manuscript on IEEE Xplore Open Preview
Tue, 16 Sep, 15:00 - 15:15 Anchorage Time (UTC -8)

TU4.L11.1: WEAKLY SUPERVISED DEFECT LOCALIZATION WITH RESIDUAL FEATURES
Gaku Minamoto, Satoshi Ito, Osamu Yamaguchi, Takahiro Takimoto, Toshiba Corporation, Japan
Tue, 16 Sep, 15:15 - 15:30 Anchorage Time (UTC -8)

TU4.L11.2: Holism to Atomism: Enhancing the Vision-Language Alignment for Cross-Modal Few-Shot Learning
Boyu Yang, Mingjie Li, Xi Chen, Liang Li, Chao Deng, Junlan Feng, china mobile research institute, China
Tue, 16 Sep, 15:30 - 15:45 Anchorage Time (UTC -8)

TU4.L11.3: NO-REFERENCE TEXTURED MESH QUALITY ASSESSMENT USING GRAPH-BASED FEATURES
Ryosuke Watanabe, Hanif Fermanda Putra, Tomoaki Konno, Sei Naito, KDDI Research, Inc., Japan