BISP-L2.6

CE-DDIM: Conditional Efficient Diffusion Method for Cone-Beam CT Enhancement

Zipei Zhang, Aalto University, Finland; Zhikai Yang, KTH Royal Institute of Technology, Sweden; Mikko Saukkoriipi, Jaakko Sahlsten, Xinjue Wang, Aalto University, Finland; Rodrigo Moreno, KTH Royal Institute of Technology, Sweden; Kimmo Kaski, Aalto University, Finland
Session:
BISP-L2: Image quality & image reconstruction Oral
Track:
Biomedical Signal and Image Processing [BI]
Location:
Room 122+123
Presentation Time:
Tue, 5 May, 18:10 - 18:30
Presentation
Discussion
Resources
No resources available.
Session BISP-L2
BISP-L2.1: Joint Learning of Deterministic and Stochastic Parameters of Sparse Bayesian Neural Networks for Probabilistic Image Registration
Yong Hua, Xuan Yang, Yang Zhao, Shenzhen University, China
BISP-L2.2: Wavelet-Consistent Diffusion Posterior Sampling for Limited-Angle and Sparse-View CT Reconstruction
Jingwen Hu, Chong Fu, Northeastern University, China
BISP-L2.3: ESTABLISHING STOCHASTIC OBJECT MODELS FROM NOISY DATA VIA AMBIENT MEASUREMENT-INTEGRATED DIFFUSION
Xiaoning Lei, Contemporary Amperex Technology Co.Limited, China; Jianwei Sun, Shanghai Jiao Tong University, China; Wenhao Cai, East China Normal University, China; Xichen Xu, Yanshu Wang, Hu Gao, Shanghai Jiao Tong University, China
BISP-L2.4: Multi-Expert Distillation for Degradation-Aware Low-Dose CT Enhancement
Yousra Taifour, Université Sorbonne Paris Nord, France; Marouane Tliba, University of Orleans, France; Azeddine BEGHDADI, Aladine Chetouani, Zuheng Ming, Marie Luong, Université Sorbonne Paris Nord, France; Habib zaidi, Geneva University Hospitals, Switzerland
BISP-L2.5: PHYSICS-GUIDED DIFFUSION PRIORS FOR MULTI-SLICE RECONSTRUCTION IN SCIENTIFIC IMAGING
Laurentius Valdy, Richard D. Paul, Alessio Quercia, Zhuo Cao, Xuan Zhao, Hanno Scharr, Arya Bangun, Forschungszentrum Jülich, IAS-8, Germany
BISP-L2.6: CE-DDIM: Conditional Efficient Diffusion Method for Cone-Beam CT Enhancement
Zipei Zhang, Aalto University, Finland; Zhikai Yang, KTH Royal Institute of Technology, Sweden; Mikko Saukkoriipi, Jaakko Sahlsten, Xinjue Wang, Aalto University, Finland; Rodrigo Moreno, KTH Royal Institute of Technology, Sweden; Kimmo Kaski, Aalto University, Finland
Contacts