SS-L13: Next-Generation Wi-Fi Sensing: Part II
Thu, 18 Apr, 16:30 - 18:30 (UTC +9)
Location: Room 205B
Session Type: Lecture
Session Co-Chairs: Nuria Gonzalez Prelcic, University of California San Diego and Pu (Perry) Wang, Mitsubishi Electric Research Laboratories (MERL)
Track: Special Sessions
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Thu, 18 Apr, 16:30 - 16:50 (UTC +9)
 

SS-L13.1: INTEGRATED SENSING AND COMMUNICATION IN UNLICENSED MMWAVE BANDS: JOINT BEAMFORMING TRAINING AND ENERGY ALLOCATION
Qimei Chen, Yipeng Liang, Hao Jiang, Wuhan University, United States of America
Thu, 18 Apr, 16:50 - 17:10 (UTC +9)
 

SS-L13.2: Object Trajectory Estimation with Multi-Band Wi-Fi Neural Dynamic Fusion
Sorachi Kato, Pu Wang, Toshiaki Koike-Akino, Mitsubishi Electric Research Laboratories (MERL), United States of America; Takuya Fujihashi, Osaka University, Japan; Hassan Mansour, Petros Boufounos, Mitsubishi Electric Research Laboratories (MERL), United States of America
Thu, 18 Apr, 17:10 - 17:30 (UTC +9)
 

SS-L13.3: Wi-Fi based Indoor Monitoring enhanced by Multimodal Fusion
Chiori Hori, Pu Wang, Mahbub Rahman, Cristian Vaca-Rubio, Sameer Khurana, Anoop Cherian, Jonathan Le Roux, Mitsubishi Electric Research Laboratories (MERL), United States of America
Thu, 18 Apr, 17:30 - 17:50 (UTC +9)
 

SS-L13.4: MONOSTATIC DMG PASSIVE SENSING WITH HYPOTHESIS TESTING
PU WANG, Petros Boufounos, Mitsubishi Electric Research Laboratories (MERL), United States of America
Thu, 18 Apr, 17:50 - 18:10 (UTC +9)
 

SS-L13.5: WiFiAct: Enhancing Human Sensing Through Environment Robust Preprocessing and Bayesian Self-Supervised Learning
Niall Lyons, Avik Santra, Vikram Kumar Ramanna, Kiran Uln, Rakesh Taori, Ashutosh Pandey, Infineon Technologies, United States of America
Thu, 18 Apr, 18:10 - 18:30 (UTC +9)
 

SS-L13.6: High Accuracy Device Localization in Indoor mmWave Networks Exploiting Channel Sparsity and Virtual Anchor Mapping
Joan Palacios, North Carolina State University, United States of America; Murat Bayraktar, Nuria Gonzalez-Prelcic, University of California San Diego, United States of America; Hao Chen, Samsung Research America, United States of America