Moein Ahmadi, Mohammad Alaee-Kerahroodi, Linlong Wu, Bhavani Shankar M. R., Björn Ottersten, Interdisciplinary Centre for Security, Reliability and Trust (SnT), University of Luxembourg, Luxembourg

Hugo Brehier, CentraleSupelec, France; Arnaud Breloy, Univ. Paris-Nanterre, France; Chengfang Ren, CentraleSupelec, France; Guillaume Ginolhac, Univ. Savoie Mont-Blanc, France

Zihan Chen, Xiaolu Zeng, Xiaopeng Yang, Jiarong Zhao, Beijing Institute of Technology, China; Junbo Gong, Beijing Institute of Technology Chongqing Innovation Center, China

Edoardo Focante, Nitin Jonathan Myers, Geethu Joseph, Delft University of Technology, Netherlands; Ashish Pandharipande, NXP Semiconductors Inc., Netherlands

Shen Zhong, Zhongyu Li, Junjie Wu, Jianyu Yang, University of Electronic Science and Technology of China, China

Wen-Qin Wang, University of Electronic Science and Technology of China, China

Biao Xue, Gong Zhang, Nanjing University of Aeronautics and Astronautics, China; Fulvio Gini, Maria Greco, University of Pisa, Italy; Henry Leung, University of Calgary, Canada

Michael Shifrin, Ben-Gurion University of the Negev, Israel; Joseph Tabrikian, Ben Gurion University of the Negev, Israel; Igal Bilik, Ben-Gurion University of the Negev, Israel

Mahdi Koloushani, Sharif University of Technology, Iran (Islamic Republic of); Mohammad Mahdi Naghsh, Mohammad Reza Taban, Isfahan University of Technology, Iran (Islamic Republic of); Seyed Mohammad Karbasi, Sharif University of Technology, Iran (Islamic Republic of)

Jiancheng Liao, Xiaolu Zeng, Xiaopeng Yang, Zixiang Yin, Beijing Institute of Technology, China; Junbo Gong, Beijing Institute of Technology Chongqing Innovation Center, China

Salil Parth Tripathi, IMT Atlantique, France; Bertrand Chapron, Ifremer, France; Fabrice Collard, Gilles Guitton, Manuel Lopez-Radcenco, OceanDataLab, France; Alexis Mouche, Ifremer, France; Ronan Fablet, IMT Atlantique, France

Tunc Alkanat, Ashish Pandharipande, NXP Semiconductors, Netherlands