Technical Program

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SS-L17: Model Based Deep Learning

Session Type: Lecture
Time: Thursday, 7 May, 11:30 - 13:30
Location: On-Demand
Virtual Session: View on Virtual Platform
Session Chairs: Yonina C. Eldar, Weizmann Institute of Science and Ruud JG van Sloun, Eindhoven University of Technology
 
 SS-L17.1: DEEP SOFT INTERFERENCE CANCELLATION FOR MIMO DETECTION
         Nir Shlezinger; Weizmann Institute of Science
         Rong Fu; Tsinghua University
         Yonina Eldar; Weizmann Institute of Science
 
 SS-L17.2: AN EMPIRICAL BAYES APPROACH TO PARTIALLY LABELED AND SHUFFLED DATA SETS
         Alex Dytso; Princeton University
         H. Vincent Poor; Princeton University
 
 SS-L17.3: REINFORCED DEPTH-AWARE DEEP LEARNING FOR SINGLE IMAGE DEHAZING
         Tiantong Guo; Pennsylvania State University
         Vishal Monga; Pennsylvania State University
 
 SS-L17.4: LEARNING PLUG-AND-PLAY PROXIMAL QUASI-NEWTON DENOISERS
         Abdullah Al-Shabili; New York University
         Hassan Mansour; Mitsubishi Electric Research Laboratories (MERL)
         Petros T. Boufounos; Mitsubishi Electric Research Laboratories (MERL)
 
 SS-L17.5: JOINT OPTIMIZATION OF SAMPLING PATTERNS AND DEEP PRIORS FOR IMPROVED PARALLEL MRI
         Hemant Kumar Aggarwal; University of Iowa
         Mathews Jacob; University of Iowa
 
 SS-L17.6: LEARNING SAMPLING AND MODEL-BASED SIGNAL RECOVERY FOR COMPRESSED SENSING MRI
         Iris A.M. Huijben; Eindhoven University of Technology
         Bastiaan S. Veeling; University of Amsterdam
         Ruud J.G. van Sloun; Eindhoven University of Technology