Technical Program

M1: Image Analysis I and Machine Learning

Session Type: Lecture
Time: Monday, March 30, 09:05 - 10:05
Location: New Mexico Room
 
M1.1: FORENSIC SCANNER IDENTIFICATION USING MACHINE LEARNING
         Ruiting Shao; Purdue University
         Edward Delp; Purdue University
 
M1.2: LEARNING SHAPES ON IMAGE SAMPLED POINTS WITH DYNAMIC GRAPH CNNS
         Juan Castorena; Los Alamos National Laboratory
         Diane Oyen; Los Alamos National Laboratory
 
M1.3: THE IMPORTANCE OF THE INSTANTANEOUS PHASE FOR FACE DETECTION USING SIMPLE CONVOLUTIONAL NEURAL NETWORKS
         Luis Armando Sanchez Tapia; University of New Mexico
         Marios Pattichis; University of New Mexico
         Sylvia Celedon-Pattichis; University of New Mexico
         Carlos LopezLeiva; University of New Mexico
 
M1.4: DATA-DRIVEN METHODS FOR SOLVING LARGE-SCALE INVERSE PROBLEMS WITH APPLICATIONS TO SUBSURFACE IMAGING
         Youzuo Lin; Los Alamos National Laboratory
         James Theiler; Los Alamos National Laboratory
         Brendt Wohlberg; Los Alamos National Laboratory
         Yue Wu; University of California, Davis
         Zhongping Zhang; Boston University