Hiroo Irobe, Wataru Aoki, Tokyo Institute of Technology, Japan; Kimihiro Yamazaki, Fujitsu, Japan; Yuhui Zhang, Tokyo Institute of Technology, Japan; Takumi Nakagawa, Tokyo Institute of Technology, RIKEN AIP, Japan; Hiroki Waida, Tokyo Institute of Technology, Japan; Yuichiro Wada, Fujitsu, RIKEN AIP, Japan; Takafumi Kanamori, Tokyo Institute of Technology, RIKEN AIP, Japan