| Paper ID | WA.PH.5 |
| Paper Title |
Artifact-free Thin Cloud Removal using GANs |
| Authors |
Takahiro Toizumi, NEC Corporation, Japan; Simone Zini, University of Milano-Bicocca, Italy; Kazutoshi Sagi, Eiji Kaneko, Masato Tsukada, NEC Corporation, Japan; Raimondo Schettini, University of Milano-Bicocca, Italy |
| Session | WA.PH: Defect Removal |
| Location | Room 101 (1F) - Poster Area H |
| Session Time: | Wednesday, 25 September, 10:30 - 12:18 |
| Presentation Time: | Wednesday, 25 September, 10:30 - 12:18 |
| Presentation |
Poster
|
| Topic |
TEC: Image & Video Processing Techniques: TEC-RST Restoration and Enhancement |
| IEEE Xplore Open Preview |
Click here to view in IEEE Xplore |