Technical Program

Paper Detail

Paper IDWA.L4.3
Paper Title A METROLOGICAL MEASUREMENT OF TEXTURE IN HYPERSPECTRAL IMAGES USING RELOCATED SPECTRAL DIFFERENCE OCCURRENCE MATRIX
Authors Rui Jian Chu, Noël Richard, Christine Fernandez-Maloigne, University of Poitiers, France; Jon Yngve Hardeberg, Norwegian University of Science and Technology, Norway
SessionWA.L4: Multispectral & Hyperspectral Image Processing
LocationRoom 201A (2F)
Session Time:Wednesday, 25 September, 10:30 - 12:18
Presentation Time:Wednesday, 25 September, 11:06 - 11:24
Presentation Lecture
Topic ECI: Electronic and Computational Imaging: ECI-COL Color and Multispectral Imaging
IEEE Xplore Open Preview  Click here to view in IEEE Xplore