Marko Tuononen, Heikki Penttinen, Nokia Group, Finland; Ville Hautamäki, University of Eastern Finland, Finland

Tongkai Li, Weifeng Zhu, Shuowen Zhang, Jiannong Cao, The Hong Kong Polytechnic University, Hong Kong; Shuguang Cui, The Chinese University of Hong Kong, Shenzhen, China; Liang Liu, The Hong Kong Polytechnic University, Hong Kong

Muhammad Ahmed Mohsin, Muhammad Umer, Stanford University, United States of America; Ahsan Bilal, University of Oklahoma, United States of America; Muhammad Ibtsaam Qadir, Purdue University, United States of America; Muhammad Ali Jamshed, University of Glasgow, United Kingdom of Great Britain and Northern Ireland; Dean Hougen, University of Oklahoma, United States of America; John M. Cioffi, Stanford University, United States of America

Panqi Chen, Lei Cheng, Zhejiang University, China; Li You, Southeast University, China; Peter Gerstoft, Technical University of Denmark, United States of America

Jinze Wu, Politecnico di Torino, China; Zhi Li, Sun Yat-sen University, China; Zhiyun Lin, Southern University of Science and Technology, China; Hui Cheng, Sun Yat-sen University, China; Lorenzo Zino, Alessandro Rizzo, Politecnico di Torino, Italy

Xiyu Wang, Xiao Cai, Hei Victor Cheng, Aarhus University, Denmark