Manan Mittal, Stony Brook University, United States of America; Thomas Deppisch, Chalmers University of Technology, Sweden; Joseph Forrer, Chris Le Sueur, Zamir Ben-Hur, David Lou Alon, Daniel D.E. Wong, Reality Labs Research, Meta, Sweden

Junwei Ji, Nanyang Technological University, Singapore; Dongyuan Shi, Northwestern Polytechnical University, China; Boxiang Wang, Ziyi Yang, Haowen Li, Woon-Seng Gan, Nanyang Technological University, Singapore

Ziyi Yang, Nanyang Technological University, Singapore; Li Rao, Nanjing University, China; Zhengding Luo, Nanyang Technological University, Singapore; Dongyuan Shi, Northwestern Polytechnical University, China; Qirui Huang, Woon-Seng Gan, Nanyang Technological University, Singapore

Tao Zhuang, Shaozhe Li, Nanjing University, China; Feng Niu, National Institute of Metrology, China; Jia-Xin Zhong, The Pennsylvania State University, United States of America; Jing Lu, Nanjing University, China

Ze Li, Nanjing University, China; Haocheng Guo, Huawei Technologies Co Ltd, China; Xiaoyang Ge, Kai Chen, Jing Lu, Nanjing University, China

Shaoheng Xu, Chunyi Sun, The Australian National University, Australia; Jihui Zhang, The University of Queensland, Australia; Prasanga Samarasinghe, Thushara Abhayapala, The Australian National University, Australia

Seungryeol Paik, Kyogu Lee, Seoul National University, Korea, Republic of

Lijun Wang, Japan Advanced Institute of Science and Technology, Japan

Yoshiki Masuyama, Gordon Wichern, François Germain, MERL, United States of America; Christopher Ick, New York University, United States of America; Jonathan Le Roux, MERL, United States of America