Kazuki Shimada, Sony AI, Japan; Christian Simon, Sony Group Corporation, Japan; Takashi Shibuya, Sony AI, Japan; Shusuke Takahashi, Sony Group Corporation, Japan; Yuki Mitsufuji, Sony AI, Japan

Eleonora Grassucci, Sapienza University of Rome, Italy; Giuliano Galadini, Politecnico di Milano, Italy; Giordano Cicchetti, Aurelio Uncini, Sapienza University of Rome, Italy; Fabio Antonacci, Politecnico di Milano, Italy; Danilo Comminiello, Sapienza University of Rome, Italy

Yixuan Zhang, Fengzhou Liang, Yuta Sugiura, Keio University, Japan

Georgios Angelis, CERTH, Greece; Savas Ozkan, Sinan Mutlu, Samsung R&D Institute, United Kingdom of Great Britain and Northern Ireland; Anastasios Drosou, CERTH, Greece; Mete Ozay, Samsung R&D Institute, United Kingdom of Great Britain and Northern Ireland

Linkai Liu, Sun Yat-sen University, China; Wei Feng, Xi Zhao, Shen Zhang, JD.com, China; Xingye Chen, Huazhong University of Science and Technology, China; Zheng Zhang, Jingjing Lv, Junjie Shen, Ching Law, JD.com, China; Yuchen Zhou, Zipeng Guo, Chao Gou, Sun Yat-sen University, China

Chang Liu, University of Trento, Italy; Zihao Chen, Gongyu Chen, Chaofan Ding, Giant Network, China; Nicu Sebe, University of Trento, Italy

Junchen Fu, University of Glasgow, United Kingdom of Great Britain and Northern Ireland; Xuri Ge, Shandong University, China; Kaiwen Zheng, University of Glasgow, United Kingdom of Great Britain and Northern Ireland; Alexandros Karatzoglou, Amazon, Spain; Ioannis Arapakis, Telefónica Scientific Research, Spain; Xin Xin, Shandong University, China; Yongxin Ni, National University of Singapore, Singapore; Joemon Jose, University of Glasgow, United Kingdom of Great Britain and Northern Ireland

Keyuan Li, Shixiong Zhang, Yixuan Fang, Shuangjie Yuan, Yizhi Zou, Lu Yang, University of Electronic Science and Technology of China, China

Ziqing Yang, Houwei Cao, New York Institute of Technology, United States of America

Chen He, Bowen Yang, Yuqi Pang, Yun Cao, University of Chinese Academy of Sciences, China