HLT-L1: Applications: Translation, Summarization, QA |
Session Type: Lecture |
Time: Thursday, May 16, 13:00 - 15:00 |
Location: Syndicate 1 |
Session Chairs: Lin-shan Lee, Academia Sinica and Steve Renals, University of Edinburgh
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HLT-L1.1: TOWARDS UNSUPERVISED SPEECH-TO-TEXT TRANSLATION |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Yu-An Chung; Massachusetts Institute of Technology |
Wei-Hung Weng; Massachusetts Institute of Technology |
Schrasing Tong; Massachusetts Institute of Technology |
James Glass; Massachusetts Institute of Technology |
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HLT-L1.2: TOWARDS END-TO-END SPEECH-TO-TEXT TRANSLATION WITH TWO-PASS DECODING |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Tzu-Wei Sung; National Taiwan University |
Jun-You Liu; National Taiwan University |
Hung-Yi Lee; National Taiwan University |
Lin-Shan Lee; National Taiwan University |
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HLT-L1.3: LEVERAGING WEAKLY SUPERVISED DATA TO IMPROVE END-TO-END SPEECH-TO-TEXT TRANSLATION |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Ye Jia; Google, Inc. |
Melvin Johnson; Google, Inc. |
Wolfgang Macherey; Google, Inc. |
Ron J. Weiss; Google, Inc. |
Yuan Cao; Google, Inc. |
Chung-Cheng Chiu; Google, Inc. |
Naveen Ari; Google, Inc. |
Stella Laurenzo; Google, Inc. |
Yonghui Wu; Google, Inc. |
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HLT-L1.4: A HIERARCHICAL NEURAL SUMMARIZATION FRAMEWORK FOR SPOKEN DOCUMENTS |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Tzu-En Liu; National Taiwan Normal University |
Shih-Hung Liu; Delta Management System |
Berlin Chen; National Taiwan Normal University |
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HLT-L1.5: ILP-BASED COMPRESSIVE SPEECH SUMMARIZATION WITH CONTENT WORD COVERAGE MAXIMIZATION AND ITS ORACLE PERFORMANCE ANALYSIS |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Atsunori Ogawa; NTT Corporation |
Tsutomu Hirao; NTT Corporation |
Tomohiro Nakatani; NTT Corporation |
Masaaki Nagata; NTT Corporation |
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HLT-L1.6: SLIQA-I: TOWARDS COLD-START DEVELOPMENT OF END-TO-END SPOKEN LANGUAGE INTERFACE FOR QUESTION ANSWERING |
Manuscript Link: Click here to view manuscript on IEEE Xplore |
Yilin Shen; Samsung Research America |
Yu Wang; Samsung Research America |
Abhishek Patel; Samsung Research America |
Hongxia Jin; Samsung Research America |
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