Technical Program

DISPS-L1: Design and Implementation of Emerging Signal Processing Systems: Machine Learning

Session Type: Lecture
Time: Tuesday, May 14, 13:30 - 15:30
Location: Syndicate 4
Session Chair: Pei-Yun Tsai, National Central University, Taiwan
 
DISPS-L1.1: MEMORIZATION CAPACITY OF DEEP NEURAL NETWORKS UNDER PARAMETER QUANTIZATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Yoonho Boo; Seoul National Univeristy
         Sungho Shin; Seoul National Univeristy
         Wonyong Sung; Seoul National Univeristy
 
DISPS-L1.2: STOCHASTIC DATA-DRIVEN HARDWARE RESILIENCE TO EFFICIENTLY TRAIN INFERENCE MODELS FOR STOCHASTIC HARDWARE IMPLEMENTATIONS
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Bonan Zhang; Princeton University
         Lung-Yen Chen; Princeton University
         Naveen Verma; Princeton University
 
DISPS-L1.3: JOINT OPTIMIZATION OF QUANTIZATION AND STRUCTURED SPARSITY FOR COMPRESSED DEEP NEURAL NETWORKS
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Gaurav Srivastava; Arizona State University
         Deepak Kadetotad; Arizona State University
         Shihui Yin; Arizona State University
         Visar Berisha; Arizona State University
         Chaitali Chakrabarti; Arizona State University
         Jae-sun Seo; Arizona State University
 
DISPS-L1.4: REAL-TIME OBJECT DETECTION VIA PRUNING AND A CONCATENATED MULTI-FEATURE ASSISTED REGION PROPOSAL NETWORK
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Kuan Hung Shih; National Tsing Hua University
         Ching-Te Chiu; National Tsing Hua University
         Yen Yu Pu; National Tsing Hua University
 
DISPS-L1.5: USING 3D RESIDUAL NETWORK FOR SPATIO-TEMPORAL ANALYSIS OF REMOTE SENSING DATA
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Muhammad Ahmed Bhimra; LUMS
         Usman Nazir; LUMS
         Murtaza Taj; LUMS
 
DISPS-L1.6: ADAPTIVELY WEIGHTED MULTI-TASK LEARNING USING INVERSE VALIDATION LOSS
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Waseem Abbas; Mentor-a Siemens Business
         Murtaza Taj; Lahore University of Management Sciences