Hongzhi Guo, University of Electronic Science and Technology of China, China; Haoqi Wu, University of Electronic Science and Technology of China, China; Xinghe Li, University of Electronic Science and Technology of China, China; Zhihang Wang, Zishu He, Ziyang Cheng, University of Electronic Science and Technology of China, China

Dan Xu, Ziyi Cao, Mengdao xing, Xidian University, China; Jiang Qian, University of Electronic Science and Technology of China, China; Fulvio Gini, Maria Sabrina Greco, University of Pisa, Italy

Kundan Kumar, Muhammad Iqbal, Simo Särkkä, Aalto University, Finland, Finland

Mengjiao Tang, Yunnan University, China; Augusto Aubry, Antonio De Maio, University of Naples “Federico II”, Italy; Yao Rong, Yunnan University, China

Simon Trottier, Jonathan Bosse, Olivier Rabaste, ONERA, France; Philippe Forster, Université Paris-Saclay, France; Jean-Philippe Ovarlez, ONERA, France

Pia Addabbo, Università degli Studi “Giustino Fortunato”, Italy; Danilo Orlando, Università degli Studi di Pisa, Italy; Giuseppe Ricci, Università del Salento, Italy; Louis Scharf, Colorado State University, United States

Seyedeh Fatemeh Mirhosseini, Mohammad Alaee-Kerahroodi, University of Luxembourg, Luxembourg; Gabriel Beltrao, Udo Schroeder, IEE S.A., Luxembourg; Bhavani Shankar {M}. {R}., University of Luxembourg, Luxembourg

Hongwei Wang, Jun Fang, Xi Zheng, Hongbin Li, Jilin Wang, University of Electronic Science and Technology of China, China

Nacer YOUSFI, SafranGroup, France; Karim Abed-meraim, Orléans university, France; Mohammed EL BADAOUI, SafranGroup, France