Authors |
Shigeki Karita, NTT Communication Science Laboratories, Japan; Nanxin Chen, Johns Hopkins University, United States; Tomoki Hayashi, Nagoya University, Japan; Takaaki Hori, Mitsubishi Electric Research Laboratories (MERL), United States; Hirofumi Inaguma, Kyoto University, Japan; Ziyan Jiang, Johns Hopkins University, United States; Masao Someki, Nagoya University, Japan; Nelson Enrique Yalta Soplin, Waseda University, Japan; Ryuichi Yamamoto, LINE Corporation, Japan; Xiaofei Wang, Shinji Watanabe, Johns Hopkins University, United States; Takenori Yoshimura, Nagoya University, Japan; Wangyou Zhang, Shanghai Jiao Tong University, China |